Defect Detection Using Event-Based Process Analysis in (Software+) Engineering Projects

W. Sunindyo, S. Biffl, C. Frühwirth, R. Mordinyi, T Moser, A. Schatten, S. Schrittwieser, E. Weippl, D. Winkler:
"Defect Detection Using Event-Based Process Analysis in (Software+) Engineering Projects";
Vortrag: 36th Euromicro Conference Software Engineering and Advanced Applications (SEAA 2010) - Work in Progress, Lille, France; 01.09.2010 - 03.09.2010; in:"Proc. 36th Euromicro Conference Software Engineering and Advanced Applications (SEAA 2010) - Work in Progress Session", E. Grosspietsch, K. Klöckner (Hrg.); COREP Vauban, Lille (2010), ISBN: 978-3-902457-27-1; S. 1 - 2.