Ontology-based Fault Diagnosis for Industrial Control Applications

M. Melik-Merkumians, A. Zoitl, T Moser:
"Ontology-based Fault Diagnosis for Industrial Control Applications";
Vortrag: IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Bilbao, Spanien; 13.09.2010 - 16.09.2010; in:"Proceedings IEEE Emerging Technologies and Factory Automation (ETFA 2010)", (2010), ISBN: 978-1-4244-6849-2; 4 S.