Automation Component Aspects for Efficient Unit Testing

D. Winkler,R. Hametner, S. Biffl:
"Automation Component Aspects for Efficient Unit Testing";
Vortrag: IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Mallorca; 22.09.2009 - 26.09.2009; in:"2009 IEEE Conference on Emerging Technologies&Factory Automation", (2009), 978-1-4244-2728-4/1946-0759; 8 S.